G.F. Woerlee: search on Z-Library

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1

[Japan Soc. Appl. Phys 1999 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (14-16 June 1999)] 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325) - An efficient lateral channel profiling of poly-SiGe-gated PMOSFET's for 0.1 μm CMOS low-voltage applications

Ponomarev, Y.V., Stolk, P.A., Van Brandenburg, A.C.M.C., Dachs, C.J.J., Kaiser, M., Montree, A.H., Roes, R., Schmitz, J., Woerlee, P.H.

Year:

1999

Language:

english

File:

PDF, 188 KB

english, 1999

2

RTP annealings for high-quality LPCVD interpolysilicon dielectric layers

J.H Klootwijk, H Van Kranenburg, M.H.H Weusthof, P.H Woerlee, H Wallinga

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 172 KB

english, 1998

3

Dependency of dishing on polish time and slurry chemistry in Cu CMP

V Nguyen, H VanKranenburg, P Woerlee

Journal:

Microelectronic Engineering

Year:

2000

Language:

english

File:

PDF, 524 KB

english, 2000

4

A simple model for quantisation effects in heavily-doped silicon MOSFETs at inversion conditions

M.J. van Dort, P.H. Woerlee, A.J. Walker

Journal:

Solid-State Electronics

Year:

1994

Language:

english

File:

PDF, 428 KB

english, 1994

5

[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Channel profile engineering of 0.1 μm-Si MOSFETs by through-the-gate implantation

Ponomarev, Y.V., Stolk, P.A., van Brandenburg, A.C.M.C., Roes, R., Montree, A.H., Schmitz, J., Woerlee, P.H.

Year:

1998

Language:

english

File:

PDF, 356 KB

english, 1998

6

[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Gate-workfunction engineering using poly-(Si,Ge) for high-performance 0.18 μm CMOS technology

Ponomarev, Y.V., Salm, C., Schmitz, J., Woerlee, P.H., Stolk, P.A., Gravesteijn, D.J.

Year:

1997

Language:

english

File:

PDF, 617 KB

english, 1997

7

Comparison of soft-breakdown triggers for large-area capacitors under constant voltage stress

Schmitz, J., Tuinhout, H.P., Kretschmann, H.J., Woerlee, P.H.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2001

Language:

english

File:

PDF, 176 KB

english, 2001

8

The influence of variable physical properties and buoyancy on heat exchanger design for near- and supercritical conditions

M. van der Kraan, M.M.W. Peeters, M.V. Fernandez Cid, G.F. Woerlee, W.J.T. Veugelers, G.J. Witkamp

Journal:

The Journal of Supercritical Fluids

Year:

2005

Language:

english

File:

PDF, 138 KB

english, 2005

9

Leachability of metals from fly ash: leaching tests before and after extraction with supercritical CO2 and extractants

C Kersch, S Peretó Ortiz, G.F Woerlee, G.J Witkamp

Journal:

Hydrometallurgy

Year:

2004

Language:

english

File:

PDF, 265 KB

english, 2004

10

Influence of high substrate doping levels on the threshold voltage and the mobility of deep-submicrometer MOSFETs

van Dort, M.J., Woerlee, P.H., Walker, A.J., Juffermans, C.A.H., Lifka, H.

Journal:

IEEE Transactions on Electron Devices

Year:

1992

Language:

english

File:

PDF, 728 KB

english, 1992

11

[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Accurate thermal noise model for deep-submicron CMOS

Scholten, A.J., Tromp, H.J., Tiemeijer, L.F., Van Langevelde, R., Havens, R.J., De Vreede, P.W.H., Roes, R.F.M., Woerlee, P.H., Montree, A.H., Klaassen, D.B.M.

Year:

1999

Language:

english

File:

PDF, 321 KB

english, 1999

12

Supercritical Fluid Extraction: A Study on Metal Recovery and Regeneration of β‐Diketones and Organophosphorus Extractants

Kersch, C., Witkamp, G. J., Woerlee, G. F.

Journal:

Solvent Extraction and Ion Exchange

Year:

2005

Language:

english

File:

PDF, 395 KB

english, 2005

13

Equilibrium Study on the Disperse Dyeing of Polyester Textile in Supercritical Carbon Dioxide

Van Der Kraan, M., Vanesa Fernandez Cid, M., Woerlee, G. F., Veugelers, W. J. T., Witkamp, G.-J.

Journal:

Textile Research Journal

Year:

2007

Language:

english

File:

PDF, 305 KB

english, 2007

14

Lifetime calculations of MOSFETs using depth-dependent non-local impact ionization

M.J. van Dort, J.W. Slotboom, G. Streutker, P.H. Woerlee

Journal:

Microelectronics Journal

Year:

1995

Language:

english

File:

PDF, 295 KB

english, 1995

15

Analysis of tin dioxide coatings by multiple angle of incidence ellipsometry

H. Haitjema, G.F. Woerlee

Journal:

Thin Solid Films

Year:

1989

Language:

english

File:

PDF, 111 KB

english, 1989

16

RF-CMOS performance trends

Woerlee, P.H., Knitel, M.J., van Langevelde, R., Klaassen, D.B.M., Tiemeijer, L.F., Scholten, A.J., Zegers-van Duijnhoven, A.T.A.

Journal:

IEEE Transactions on Electron Devices

Year:

2001

Language:

english

File:

PDF, 161 KB

english, 2001

17

Base promoted etherification reaction of a non-polar reactive dye and methanol by zeolite KA

M.V. Fernandez Cid, M. van der Kraan, W.J.T. Veugelers, G.F. Woerlee, H. van Bekkum, G.J. Witkamp

Journal:

Microporous and Mesoporous Materials

Year:

2005

Language:

english

File:

PDF, 200 KB

english, 2005

18

Effect of heating ramp rates on transient enhanced diffusion in ion-implanted silicon

Mannino, G., Stolk, P. A., Cowern, N. E. B., de Boer, W. B., Dirks, A. G., Roozeboom, F., van Berkum, J. G. M., Woerlee, P. H., Toan, N. N.

Journal:

Applied Physics Letters

Year:

2001

Language:

english

File:

PDF, 314 KB

english, 2001

19

A modelling framework for assessment of arterial compliance by fusion of oscillometry and pulse wave velocity information

Bogatu, Laura I., Turco, Simona, Mischi, Massimo, Woerlee, Pierre, Bouwman, Arthur, Korsten, Erik H.H.M., Muehlsteff, Jens

Journal:

Computer Methods and Programs in Biomedicine

Year:

2020

File:

PDF, 2.05 MB

2020

20

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - RF-distortion in deep-submicron CMOS technologies

van Langevelde, R., Tiemeijer, L.F., Havens, R.J., Knitel, M.J., Ores, R.F.M., Woerlee, P.H., Klaassen, D.B.M.

Year:

2000

Language:

english

File:

PDF, 315 KB

english, 2000

21

Deposited inter-polysilicon dielectrics for nonvolatile memories

Klootwijk, J.H., van Kranenburg, H., Woerlee, P.H., Wallinga, H.

Journal:

IEEE Transactions on Electron Devices

Year:

1999

Language:

english

File:

PDF, 436 KB

english, 1999

22

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Impact of process scaling on 1/f noise in advanced CMOS technologies

Knitel, M.J., Woerlee, P.H., Scholten, A.J., Zegers-Van Duijnhoven, A.

Year:

2000

Language:

english

File:

PDF, 312 KB

english, 2000

23

Low Hydrogen Content Silicon Nitride Films Deposited at Room Temperature with an ECR Plasma Source

Isai, Gratiela I., Holleman, Jisk, Wallinga, Hans, Woerlee, Pierre H.

Journal:

Journal of The Electrochemical Society

Year:

2004

Language:

english

File:

PDF, 625 KB

english, 2004

24

Kinetics study of a dichlorotriazine reactive dye in supercritical carbon dioxide

M.V. Fernandez Cid, M. van der Kraan, W.J.T. Veugelers, G.F. Woerlee, G.J. Witkamp

Journal:

The Journal of Supercritical Fluids

Year:

2004

Language:

english

File:

PDF, 104 KB

english, 2004

25

Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films

van Attekum, P. M. Th. M., Woerlee, P. H., Verkade, G. C., Hoeben, A. A. M.

Journal:

Physical Review B

Year:

1984

Language:

english

File:

PDF, 1.48 MB

english, 1984

26

Dyeing of natural and synthetic textiles in supercritical carbon dioxide with disperse reactive dyes

M. van der Kraan, M.V. Fernandez Cid, G.F. Woerlee, W.J.T. Veugelers, G.J. Witkamp

Journal:

The Journal of Supercritical Fluids

Year:

2007

Language:

english

File:

PDF, 507 KB

english, 2007

27

[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Quantum-mechanical threshold voltage shifts of MOSFETs caused by high levels of channel doping

van Dort, M.J., Woerlee, P.H., Walker, A.J., Juffermans, C.A.H., Lifka, H.

Year:

1991

Language:

english

File:

PDF, 260 KB

english, 1991

28

Excellent dye fixation on cotton dyed in supercritical carbon dioxide using fluorotriazine reactive dyes

Fernandez Cid, M. V., van Spronsen, J., van der Kraan, M., Veugelers, W. J. T., Woerlee, G. F., Witkamp, G. J.

Journal:

Green Chemistry

Year:

2005

Language:

english

File:

PDF, 592 KB

english, 2005

29

Supercritical Fluid Extraction of Heavy Metals from Fly Ash

Kersch, Christof, Woerlee, Geert F., Witkamp, Geert J.

Journal:

Industrial & Engineering Chemistry Research

Year:

2004

Language:

english

File:

PDF, 320 KB

english, 2004

30

Expression for the Viscosity and Diffusivity Product Applicable for Supercritical Fluids

Woerlee, Geert F.

Journal:

Industrial & Engineering Chemistry Research

Year:

2001

Language:

english

File:

PDF, 74 KB

english, 2001

31

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - A record high 150 GHz f/sub max/ realized at 0.18 μm gate length in an industrial RF-CMOS technology

Tiemeijer, L.F., Boots, H.M.J., Havens, R.J., Scholten, A.J., de Vreede, P.H.W., Woerlee, P.H., Heringa, A., Klaassen, D.B.M.

Year:

2001

Language:

english

File:

PDF, 426 KB

english, 2001

32

[IEEE 1993 International Symposium on VLSI Technology, Systems, and Applications Technical Papers - Taipei, Taiwan (12-14 May 1993)] 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers - N/sub 2/O nitrided gate dielectric technology for 0.25 mu m CMOS

Woerlee, P.H., Lifka, H., Montree, A.H., Paulzen, G.M., Pomp, H., Woltjer, R.

Year:

1993

Language:

english

File:

PDF, 311 KB

english, 1993

33

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - LPCVD SiO/sub 2/ layers prepared from SiH/sub 4/ and O/sub 2/ at 450°C in a RTP

Cobianu, C., Rem, J.B., Klootwijk, J.H., Weusthof, M.H.H., Holleman, J., Woerlee, P.H.

Year:

1995

Language:

english

File:

PDF, 433 KB

english, 1995

34

Energy spectra of electrons produced in collisions of multiply charged neon ions with noble-gas atoms

Woerlee, P H, Sherbini, T M El, Heer, F J de, Saris, F W

Journal:

Journal of Physics B Atomic and Molecular Physics

Year:

1979

Language:

english

File:

PDF, 431 KB

english, 1979

35

A ventilation technique for oxygenation and carbon dioxide elimination in CPR: Continuous insufflation of oxygen at three levels of pressure in a pig model

Ordelman, Simone C.M.A., Aelen, Paul, Woerlee, Pierre H., van Berkom, Paul F.J., Scheffer, Gert-Jan, Noordergraaf, Gerrit J.

Journal:

Year:

2015

Language:

english

File:

PDF, 371 KB

english, 2015

36

Intrathoracic transmural pressure is not effected by low forces

Paulussen, Igor, Weston, James, Aelen, Paul, Woerlee, Pierre, Noordergraaf, Gerrit Jan

Journal:

Year:

2012

Language:

english

File:

PDF, 54 KB

english, 2012

37

[IEEE CAS '99 Proceedings. 1999 International Semiconductor Conference - Sinaia, Romania (5-9 Oct. 1999)] CAS '99 Proceedings. 1999 International Semiconductor Conference (Cat. No.99TH8389) - Visible light emission from reverse-biased silicon nanometer-scale diode-antifuses

Houtsma, V.E., Holleman, J., Akil, N., Phoung, L.M., Zieren, V., van den Berg, A., Walling, H., Woerlee, P.H.

Year:

1999

Language:

english

File:

PDF, 357 KB

english, 1999

38

Gate current and oxide reliability in p/sup +/ poly MOS capacitors with poly-Si and poly-Ge/sub 0.3/Si/sub 0.7/ gate material

Salm, C., Klootwijk, J.H., Ponomarev, Y., Boos, P.W.M., Gravesteijn, D.J., Woerlee, P.H.

Journal:

IEEE Electron Device Letters

Year:

1998

Language:

english

File:

PDF, 69 KB

english, 1998

39

The production of continuous electron spectra in collisions of heavy ions and atoms. II. Direct coupling with the continuum

Woerlee, P H, Gordeev, Yu S, Waard, H de, Saris, F W

Journal:

Journal of Physics B Atomic and Molecular Physics

Year:

1981

Language:

english

File:

PDF, 731 KB

english, 1981

40

[IEEE 30th European Solid-State Device Research Conference - Cork, Ireland (2000.9.11-2000.9.13)] 30th European Solid-State Device Research Conference - Electrical Characterisation of Gate Dielectrics Deposited with Multipolar Electron Cyclotron Resonance Plasma Source

Isai, G.I., Kovalgin, A.Y., Holleman, J., Woerlee, P.H., Wallinga, H., Cobianu, C.

Year:

2000

Language:

english

File:

PDF, 71 KB

english, 2000

41

Conduction and trapping mechanisms in SiO[sub 2] films grown near room temperature by multipolar electron cyclotron resonance plasma enhanced chemical vapor deposition

G. I. Isai, J. Holleman, H. Wallinga, P. H. Woerlee

Year:

2004

Language:

english

File:

PDF, 504 KB

english, 2004

42

The production mechanism and spectral distribution of K MO X-rays in collisions of 35-200 keV N+-N

T. P. Hoogkamer, P. H. Woerlee, F. W. Saris, W. E. Meyerhof

Year:

1978

Language:

english

File:

PDF, 619 KB

english, 1978

43

Lightly nitrided gate oxides for 0.25 μm CMOS

H.G. Pomp, A.E.T. Kuiper, H. Lifka, A.H. Montree, P.H. Woerlee

Journal:

Microelectronic Engineering

Year:

1993

Language:

english

File:

PDF, 356 KB

english, 1993

44

[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Multiple Gate Oxide Technology Using Fluorine Implantation

Woerlee, P.H., Knitel, M.J., Meyssen, V.M.H., Velghe, R.M.D.A., Zegers van Duijnhoven, A.T.A.

Year:

2001

Language:

english

File:

PDF, 416 KB

english, 2001

45

DEVICE CHARACTERISATION OF A HIGH DENSITY HALF-MICRON CMOS PROCESS

WOERLEE, P. H., JUFFERMANS, C. A.H., LIFKA, H., WALKER, A. J., POORTER, T., MERKS-EPPINGBROEK, H. J.H., OUDE LANSINK, F. M.

Journal:

Le Journal de Physique Colloques

Year:

1988

Language:

english

File:

PDF, 1.65 MB

english, 1988

46

Fabrication of 0.5 μm NMOS-devices by all level X-ray lithography

U. Mackens, U. Mescheder, F. Mund, H. Lüthje, H. Lifka, C.A.H. Juffermans, P.H. Woerlee, A.J. Walker

Journal:

Microelectronic Engineering

Year:

1989

Language:

english

File:

PDF, 384 KB

english, 1989

47

Compression velocity during CPR: Why automated CPR may perform better than manual CPR

P. Aelen, I. Paulussen, P. van Berkom, A. Venema, G.J. Noordergraaf, P. Woerlee

Journal:

Year:

2010

Language:

english

File:

PDF, 82 KB

english, 2010

48

Amino acid based surfactants for dry-cleaning with high-pressure carbon dioxide

M.J.E. van Roosmalen, G.F. Woerlee, G.J. Witkamp

Journal:

The Journal of Supercritical Fluids

Year:

2004

Language:

english

File:

PDF, 305 KB

english, 2004

49

Growth and properties of LPCVD W–Si–N barrier layers

S. Bystrova, J. Holleman, P.H. Woerlee

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 618 KB

english, 2001

50

Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's

Woltjer, R., Paulzen, G.M., Pomp, H.G., Lifka, H., Woerlee, P.H.

Journal:

IEEE Transactions on Electron Devices

Year:

1995

Language:

english

File:

PDF, 648 KB

english, 1995

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